2020 官網(wǎng)升級(jí)中!現(xiàn)在您訪問官網(wǎng)的瀏覽器設(shè)備分辨率寬度低于1280px請(qǐng)使用高分辨率寬度訪問。
"For medical equipment, electromagnetic compatibility should be considered at the time of design. Generally, there are three ways to rectify electromagnetic interference: shielding, grounding and filtering. Shielding materials or microwave absorbing materials can be used to help solve the electromagnetic shielding problem. The solution Zhaoke recommends using microwave absorbing materials to absorb electromagnetic waves and eliminate electromagnetic interference, which can effectively suppress the electromagnetic interference problem in electronic equipment."
CISPR 11/EN 55011/GB 4824
IEC 60601-1-2/YY 0505
IEC 61326-1/GB T18268.1
IEC 61326-2-6/GB T18268.26
IEC 61000-3-2/GB 17625.1
IEC 61000-3-3/GB 17625.2
《Industrial, scientific and medical (ISM) radio frequency equipment - Limits and methods of measurement of electromagnetic disturbance characteristics》
《Medical electrical equipment Part 1-2: General requirements for safety parallel standards: electromagnetic compatibility requirements and tests》
《Electromagnetic compatibility requirements for electrical equipment for measurement, control and laboratory use Part 1: General requirements》
《Electromagnetic compatibility requirements for electrical equipment for measurement, control and laboratory use Part 26: special requirements in vitro diagnostic (IVD) equipment》
《Electromagnetic compatibility limit harmonic current emission limit (equipment input current ≤ 16A per phase)》
《Electromagnetic compatibility limit limits the voltage change, voltage fluctuation and flicker of equipment with rated current ≤ 16A per phase and unconditionally connected in the public low-voltage power supply system》
? Electrostatic discharge immunity, contact discharge 20kV, air discharge 25kV ? Radio frequency radiation immunity - anechoic chamber method, 80mhz-18ghz ? RF radiation immunity - large current injection (BCI) 1mhz-400mhz ? Radio frequency radiation immunity -tem cell & stripline method 0.01mhz-200mhz ? Transient conduction immunity and power variation immunity ? Electrical fast transient group pulse immunity, maximum test level 4KV ? Surge (impact) immunity, maximum test level 7kv ? Voltage sag, short-time interruption and voltage variation immunity, according to iec61000-
? Conducted disturbance voltage, 150khz-108mhz, qp/av/peak ? Radiation disturbance, 150khz-2.5ghz, qp/av/peak ? Harmonic current emission test according to IEC 61000-3-2 ? Voltage fluctuation and flicker test according to IEC 61000-3-3 ? Voltage fluctuation and flicker test according to IEC 61000-3-11
Shanghai suoshen electronics is widely used in many industries, such as medical treatment, automotive electronics, home appliances, lighting, electrical appliances, power supply, power facilities and so on
Voltage dips/sags, short interruptions are caused by failures of the power grid and power facilities or sudden large changes in loads. In some cases, there will be two or more consecutive dips or interruptions. Voltage changes are caused by continuous changes in the loads connected to the grid. If the EUT cannot respond in time to changes in the power supply voltage, it may cause malfunctions. Voltage dips generators are used to evaluate the performance of electrical and electronic equipment when subjected to voltage dips/sags, short interruptions, and voltage changes. Products fully meet the requirements of standards IEC/EN 61000-4-11 and GB/T17626.11.
The impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. The lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. The product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.
Sales Hotline:400-021-6779 Switchboard:021-67727150
3255 Shengang Road, Songjiang Industrial Zone, Shanghai 2F, building 11
Silicon valley power, No. 416, Xuegang North Road, Longhua District, Shenzhen 2nd floor, building A4, Qinghu Park
No. 3, Rongjing East Street, Yizhuang Economic Development Zone, Beijing Room a1821, Lido, Rongjing