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At present, if constant DC power supply is adopted for LED lighting lamps, which are more and more widely used, it is theoretically possible to achieve constant lighting without stroboscopic. But in fact, due to the lack of industry standards, the market competition is fierce and disordered, and the market is full of low-quality LED lamps, especially indoor low-power LED lamps, which also have stroboscopic problems. In order to obtain a pure constant current source, the LED driving power supply is the key to ensure that the LED lamp does not flash. At present, LED power supply can fully meet the requirements of no stroboscopic.
CISPR 15/GB 17743
IEC 61547/GB T 18595
IEC 61000-3-2/GB 17625.1
IEC 61000-3-3/GB 17625.2
ENERGY STAR PROGRAM REQUIREMENTS
IEC 62493/GB T31275
《Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipment》
《Electromagnetic compatibility immunity requirements for general lighting equipment》
《Electromagnetic compatibility limit harmonic current emission limit (equipment input current ≤ 16A per phase)》
《Electromagnetic compatibility limit limits the voltage change, voltage fluctuation and flicker of equipment with rated current ≤ 16A per phase and unconditionally connected in the public low-voltage power supply system》
PRODUCT SPECIFICATION FOR LAMPS(LIGHT BULBS) V1.0
《Evaluation of electromagnetic radiation of lighting equipment on human body》
? Electrostatic discharge immunity, contact discharge 4KV, air discharge 8Kv ? RF electric field radiation immunity, maximum test field strength 3v/m ? Electrical fast transient burst immunity, maximum test level 1kV ? Electrical fast transient burst immunity, maximum test level 1kV ? RF conducted disturbance immunity, maximum test level 3V ? Power frequency magnetic field immunity, test field strength 3a/m ? Voltage sag, short-time interruption and voltage variation immunity, according to iec61000-4-11 ? Ringing wave immunity, according to iec61000-4-12
? Conducted disturbance voltage, 9khz-30mhz, qp/av ? Magnetic induction current, 9khz-30mhz, qp/av ? Radiated electric field disturbance or common mode terminal voltage of CDN method, 30mhz-300mhz, QP ? Harmonic current emission test according to IEC 61000-3-2 ? Voltage fluctuation and flicker test according to IEC 61000-3-3 ? Electromagnetic radiation of lighting equipment to human body shall be tested according to GB t31275
Shanghai suoshen electronics is widely used in many industries, such as medical treatment, automotive electronics, home appliances, lighting, electrical appliances, power supply, power facilities and so on
Voltage dips/sags, short interruptions are caused by failures of the power grid and power facilities or sudden large changes in loads. In some cases, there will be two or more consecutive dips or interruptions. Voltage changes are caused by continuous changes in the loads connected to the grid. If the EUT cannot respond in time to changes in the power supply voltage, it may cause malfunctions. Voltage dips generators are used to evaluate the performance of electrical and electronic equipment when subjected to voltage dips/sags, short interruptions, and voltage changes. Products fully meet the requirements of standards IEC/EN 61000-4-11 and GB/T17626.11.
The impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. The lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. The product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.
Sales Hotline：400-021-6779 Switchboard：021-67727150
3255 Shengang Road, Songjiang Industrial Zone, Shanghai 2F, building 11
Silicon valley power, No. 416, Xuegang North Road, Longhua District, Shenzhen 2nd floor, building A4, Qinghu Park
No. 3, Rongjing East Street, Yizhuang Economic Development Zone, Beijing Room a1821, Lido, Rongjing
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Multifunctional Immunity Tester
Automotive ESD Generator
Radio Frequency Electromagnetic Field Radiation Immunity System
Impulse Voltage Generator
Anechoic Chamber
EMC Antenna
