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The on-board charger is built in the new energy vehicle, which is used to charge the on-board high-voltage battery from the AC grid when parking. The battery used is usually more than 400V, and is developing towards higher voltage and higher number of battery strings. In order to realize a faster and lighter vehicle charging scheme, the new trend of charging power is upgraded from 6.6kw to 11kw. Generally, the current flows from the grid to the battery in one direction, but there are also two-way flow design schemes. Nano chip micro provides complete solutions for isolation voltage, isolation current detection, isolation drive and isolation communication, helping customers achieve higher power density OBC solutions.
GB/T7349
IEC62052-11/GB/T 17215.211
GB/T 17215.301-2007
GB/T 17215.321-2008
GB/T 17215.322-2008
GB/T 17215.323-2008
《Measurement method of radio interference of high voltage overhead transmission lines and substations》
《General requirements, tests and test conditions for alternating current measuring equipment Part 11: measuring equipment》
《Special requirements for multifunctional watt hour meters》
《Special requirements for AC measuring equipment Part 21 static active energy meters (classes 1 and 2)》
《Special requirements for AC measuring equipment Part 22 static active watt hour meter (class 0.2S and class 0.5s)》
《Special requirements for AC measuring equipment Part 23 static reactive energy meters (classes 2 and 3)》
? Multipoint temperature detection ? Can signal quality test ? Automatic code scanning
? High and low temperature test ? Damp heat test ? Salinity test ? Pneumatic test
? Connection confirmation test ? Self test phase test ? Charging readiness test ? Start up and charging phase test ? Normal charge end test ? Charging connection control sequence test ? Abnormal charging test ? Output error test
? Electrostatic discharge immunity test ? Radio frequency electromagnetic field radiation immunity test ? Electrical fast transient burst immunity test ? Surge (impact) immunity test ? Immunity test of voltage sag, short interruption and voltage change
? Voltage withstand test ? insulation resistance ? Leakage current
? Switching on impulse current ? Turn off voltage ? Set response time
? Short circuit protection test ? Overvoltage protection test ? Overload protection test ? Over power protection test
? Input and output characteristic test ? Input harmonic detection ? Ripple test ? Current and voltage stabilization test ? Efficiency test
Shanghai suoshen electronics is widely used in many industries, such as medical treatment, automotive electronics, home appliances, lighting, electrical appliances, power supply, power facilities and so on
Voltage dips/sags, short interruptions are caused by failures of the power grid and power facilities or sudden large changes in loads. In some cases, there will be two or more consecutive dips or interruptions. Voltage changes are caused by continuous changes in the loads connected to the grid. If the EUT cannot respond in time to changes in the power supply voltage, it may cause malfunctions. Voltage dips generators are used to evaluate the performance of electrical and electronic equipment when subjected to voltage dips/sags, short interruptions, and voltage changes. Products fully meet the requirements of standards IEC/EN 61000-4-11 and GB/T17626.11.
The impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. The lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. The product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.
Sales Hotline：400-021-6779 Switchboard：021-67727150
3255 Shengang Road, Songjiang Industrial Zone, Shanghai 2F, building 11
Silicon valley power, No. 416, Xuegang North Road, Longhua District, Shenzhen 2nd floor, building A4, Qinghu Park
No. 3, Rongjing East Street, Yizhuang Economic Development Zone, Beijing Room a1821, Lido, Rongjing
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Multifunctional Immunity Tester
Automotive ESD Generator
Radio Frequency Electromagnetic Field Radiation Immunity System
Impulse Voltage Generator
Anechoic Chamber
EMC Antenna
