2020 官網(wǎng)升級中!現(xiàn)在您訪問官網(wǎng)的瀏覽器設(shè)備分辨率寬度低于1280px請使用高分辨率寬度訪問。
P1 is the transient phenomenon generated when the analog power supply is disconnected from the inductive load. It is applicable to the situation that various DUTs are directly connected in parallel with the inductive load when they are used on the vehicle; P2a simulates the transient phenomenon caused by the sudden interruption of the current in the device in parallel with the DUT due to the inductance of the harness. The on-board electronic transient interference simulator RV p1p2a meets the latest requirements of iso-7637-2 and gb/t21437.
Product model
wave form
EUT capacity
Output pulse voltage us
Input impedance ri
Rising edge tr
Pulse width TD
Midpulse period T1
Number of tests
Output mode
Equipment power supply
ambient temperature
RV P1P2a
P1 (12V system) /p1 (24V system) /p2a
20A
0~-660V/0~+660V
2 Q ,4Q 10 Q ,30 Q ,50 Q
0.5~1us(10 Q)/1.5~3us( 50Q2)/0.5~1us(2Q2)
50us,200us,300us,500us,1ms,2ms
0.5~99.99s/0.2~99.99s
1~9999 times
Coaxial output, built-in coupling decoupling network output
AC220V ± 10%50/60Hz
15°C~35 C
The impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. The lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. The product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
The lightning surge generator sur 6ka is used to inspect the anti surge protection devices such as zinc oxide arrester valve piece, varistor, SPD, TVs tube, gas discharge tube, etc. for surge impact test. The product produces 8/20us surge pulse waveform, and the technical indicators of the waveform comply with the provisions of national standards and IEC standards.
In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.
Sales Hotline:400-021-6779 Switchboard:021-67727150
3255 Shengang Road, Songjiang Industrial Zone, Shanghai 2F, building 11
Silicon valley power, No. 416, Xuegang North Road, Longhua District, Shenzhen 2nd floor, building A4, Qinghu Park
No. 3, Rongjing East Street, Yizhuang Economic Development Zone, Beijing Room a1821, Lido, Rongjing