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Voltage dips/sags, short interruptions are caused by failures of the power grid and power facilities or sudden large changes in loads. In some cases, there will be two or more consecutive dips or interruptions. Voltage changes are caused by continuous changes in the loads connected to the grid. If the EUT cannot respond in time to changes in the power supply voltage, it may cause malfunctions. Voltage dips generators are used to evaluate the performance of electrical and electronic equipment when subjected to voltage dips/sags, short interruptions, and voltage changes. Products fully meet the requirements of standards IEC/EN 61000-4-11 and GB/T17626.11.
Model
Voltage variation range
Voltage change duration
Switching phase
Built-in standard test level
Fall/rise time
Voltage changes in the number of repeats
Interval cycle of voltage variation
Voltage dips mode
EUT capacity
Power supply
Ambient temperature
VDT T20
0~120%
1~9999 half cycle
0~359°synchronous, asynchronous, or automatic
0%, 40%, 70%, 80%, 120%
1μs~5μs for abrupt changes
1~9999*9999
1~9999 half cycle (HC)
Freely set
3-phase, 20A (custom specific on demand)
AC220V 50/60Hz
15℃~35℃
The impact of lightning (indirect lightning) in nature and voltage changes caused by large switch switching in power supply lines on power supply lines and communication lines is particularly large, and the impact on products may be destructive. The lightning surge generator is used to evaluate the performance of the equipment when it is subjected to high-energy disturbance from the power line port and other signal line ports. The product meets the requirements of new standards such as iec61000-4-5 and gb/t17626.5.
The lightning surge generator sur 6ka is used to inspect the anti surge protection devices such as zinc oxide arrester valve piece, varistor, SPD, TVs tube, gas discharge tube, etc. for surge impact test. The product produces 8/20us surge pulse waveform, and the technical indicators of the waveform comply with the provisions of national standards and IEC standards.
In the circuit, such as from the switching transient process (cutting off inductive loads, bouncing relay contacts, etc.), it will usually interfere with other electrical and electronic equipment in the same circuit. This kind of interference is characterized by high amplitude, short rise time, high repetition rate and low energy. Clusters of narrow pulses can charge the junction capacitance of semiconductor devices, which may cause circuit or equipment errors when accumulated to a certain extent. The burst generator determines a common reproducible evaluation basis for evaluating the performance of power supply ports, signal, control and grounding ports of electrical and electronic equipment when disturbed by electrical fast transient bursts. The products meet the requirements of new standards such as iec61000-4-4, en60100-4-4 and gb/t17626.4.
Sales Hotline：400-021-6779 Switchboard：021-67727150
3255 Shengang Road, Songjiang Industrial Zone, Shanghai 2F, building 11
Silicon valley power, No. 416, Xuegang North Road, Longhua District, Shenzhen 2nd floor, building A4, Qinghu Park
No. 3, Rongjing East Street, Yizhuang Economic Development Zone, Beijing Room a1821, Lido, Rongjing
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